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Electron Microscopy Suite
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Microscopes
Focused Ion Beam SEM (FIB-SEM)
TESCAN CLARA SEM
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JEM 1400 – a 120kV TEM from JEOL
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Basics of imaging on SEM
Basics of TEM imaging
Sample preparation for TEM
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FIB-SEM
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Negative staining for TEM
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Microscopes
Zeiss Crossbeam 550 FIB-SEM
More about our Zeiss Crossbeam
TESCAN CLARA SEM
More about our TESCAN CLARA
Jeol JEM 2100 TEM
More about our JEM 2100
Jeol JEM 1400 TEM
More about our JEM 1400
Electron microprobe Cameca SX100
More about our Cameca SX100
Remote SEM Phenom Desktop XL
More about Remote SEM
