SEM-related analysis

TEM-related analysis

1. SEM-related analysis

SEM imaging

We use Zeiss Smartsem software for controlling the microscope, capturing images and simple image annotation or measurement tools.

Energy Dispersive Spectroscopy (EDS/EDX)

We use Oxford Instruments X-Max50 detector to analyse sample’s content. We can perform:

  • Elemental spectrum analysis
  • Elemental mapping

Electron Backscattered Diffraction (EBSD)

We use Oxford Instruments NordlysNano camera to do EBSD analysis. We can assess the following properties of a material:

  • Mapping its crystallographic orientation
  • Information on crystal structure
  • Grain size distribution

Both EDS and EBSD is done through Oxford Instruments AZtec Synergy – combined acquisition software package for EDS & EBSD. The software package includes:

  • AZtec HKL acquisition software for EBSD, with:
    • HKL Channel 5 analysis software, consisting of:
      • Tango – For generating a wide variety of maps, e.g. orientation, and measuring grains.
      • Mambo – For producing pole figures and inverse pole figures from EBSD orientation data.
      • Salsa – For calculating and displaying orientation distribution functions (ODFs) to allow texture to be interpreted in Euler space.
  • AZtec Energy acquisition and analysis software for EDS
  • Simultaneous EBSD and EDS

3D electron microscopy imaging

3D electron microscopy imaging uses serial ultrathin sections and images them automatically in montage mode in SerialEM software.
The images are then corrected and automatically stitched into montages. Montages are then aligned (automatically and manually) and segmentated using Reconstruct software (

Image Processing Workstation

Our Image processing workstation is used for different types of processing and analysis of images. It is equipped with Wacom Cintiq pen display for ease of use and contains software for image analysis, such as:

  • Adobe Photoshop CS6 Extended
  • Fiji with TrackEM2 plugin
  • Matlab R2016a
  • Reconstruct
  • 3D Studio Max
  • Imaris image analysis software

TEM Energy Dispersive Spectroscopy (EDS)

Our TEM JEM-2100 produces a high probe current, which allows for improved analytical capabilities. Therefore, it is equipped with the EDS detector EDAX Genesis 4000 Energy Dispersive X-Ray system that is used for:

  • Elemental analysis
  • Elemental mapping