Basics of imaging on a scanning electron microscope SEM course

Hands-On Scanning Electron Microscope Course

Course fully tailored to your needs

Learn the basics of operating a Scanning Electron Microscope (SEM) in our comprehensive 1-day course. Through hands-on experience and expert guidance, you’ll gain new skill of operating scanning electron microscope independently.  

You’ll learn using a sample of your choice or one that you bring for the training purpose. In this way, your training is fully tailored to your needs and uses.

Comprehensive learning approach

To ensure your proficiency, we start with an overview of the SEM and a description of its components. You’ll be guided step-by-step through each procedure from loading samples, aligning, to imaging in different modes, followed by hands-on practice to reinforce your understanding. A final exercise will put your newfound knowledge to the test, empowering you to operate the SEM confidently and independently.

Upon successful completion, you’ll be presented with a certificate of attendance.

Individual and organized to suit your schedule

Flexibility is our priority – the course is organized according to your schedule. Most of our training is delivered on an individual basis, but you may attend with your work colleagues.

What you’ll learn in detail:

Description of the design & function of a scanning electron microscope (SEM).
Brief introduction to Variable Pressure (VPSE) mode for uncoated samples.
Sample mounting, preparation & loading.
Routine and advanced alignment of SEM, includes accelerating voltage selection
Description & demo of imaging modes e.g. Secondary Electron (SE), In-Lens SE, VPSE, Backscattered Electron (BSE) imaging.
Supervised practice of inserting a sample, aligning, and taking images.
There will be given exercises to choose from.
Supervised practice of inserting a sample, aligning, taking images.
There will be given exercises to choose from.

Ready to become a confident user of SEM in just 1 day?

Gain invaluable skills for your research needs.