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Electron Microscopy Suite
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Microscopes
Focused Ion Beam SEM (FIB-SEM)
TESCAN CLARA SEM
Phenom remote access SEM
JEM 1400 – a 120kV TEM from JEOL
Jeol JEM 2100 TEM
Cameca SX100 Microprobe (EMPA)
Sample preparation
Sectioning – microtomes and ultramicrotomes
Cryopreparation for TEM
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Basics of imaging on SEM
Basics of TEM imaging
Sample preparation for TEM
Basics of operating a high-resolution TEM
Advanced operation of a high-resolution TEM
Electron microscopy for 3D reconstructions
Services
SEM imaging
TEM imaging
Remote SEM
SEM EDS
Particle size analysis
Use of our instruments
FIB-SEM
SEM and TEM sample preparation (bio)
SEM and TEM sample preparation (materials)
Microsectioning
TEM elemental analysis (TEM EDS, TEM EDX) service
Negative staining for TEM
Serial sections 3D reconstruction
EBSD
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Facilities
Microscopes
Our range of SEMs and TEMs
Microscopes
Sample preparation
Various instruments for sample prep
Sample prep
Techniques
What techniques we use
Techniques
Analysis
EDS and EBSD
Analysis