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Electron Microscopy Suite
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Microscopes
Focused Ion Beam SEM (FIB-SEM)
TESCAN CLARA SEM
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JEM 1400 – a 120kV TEM from JEOL
Jeol JEM 2100 TEM
Cameca SX100 Microprobe (EMPA)
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Basics of imaging on SEM
Basics of TEM imaging
Sample preparation for TEM
Basics of operating a high-resolution TEM
Advanced operation of a high-resolution TEM
Electron microscopy for 3D reconstructions
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TEM imaging
Remote SEM
SEM EDS
Particle size analysis
Use of our instruments
FIB-SEM
SEM and TEM sample preparation (bio)
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TEM elemental analysis (TEM EDS, TEM EDX) service
Negative staining for TEM
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