ZEISS Crossbeam 550 FIB-SEM

ZEISS Crossbeam FIB-SEM

SEM for diverse applications

Versatile FIB-SEM

ZEISS Crossbeam 550 combines powerful imaging and analytical SEM with superior processing ability of a focused ion beam (FIB).  

High throughput 3D analysis and sample preparation

ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput, e.g., for cross-sectioning, TEM lamella and atom probe tip preparation, nano-patterning, and 3D tomography with analytics.

3D volume preparation for a tomography run
3D volume preparation for a tomography run
A TEM lamella from a pure copper sample
A TEM lamella from a pure copper sample
Atom probe tip (APT) from an apatite mineral
Atom probe tip (APT) from an apatite mineral
A cross-section of a plasma spray Ti coating
A cross-section of a plasma spray Ti coating

SEM capabilities

Good surface and material contrast of materials from materials to TEM thin biological sections.

Ti2C MXene sheets for energy applications
Ti2C MXene sheets for energy applications
Fe loaded nanofibers for treating iron deficiency
Fe loaded nanofibers for treating iron deficiency
Understanding gene mutation in a fruit fly eye
Understanding gene mutation in a fruit fly eye
Lithium-Ion cathode active material
Lithium-Ion cathode active material

Analytical capabilities

This microscope has state-of-the-art EDS and EBSD detectors for chemical and crystallographic analysis.

Mineral phases in angrite meteorite from 4.562 mya
Mineral phases in angrite meteorite from 4.562 mya
Creep cavitation in pure copper
Creep cavitation in pure copper
CM chondrite; a building block of solar system
CM chondrite; a building block of solar system
High altitude lake sediments made of volcanic debris
High altitude lake sediments made of volcanic debris
Volcanic glass breaking down to form carbonates
Volcanic glass breaking down to form carbonates
Polycrystal SS316 for nuclear power plant
Polycrystal SS316 for nuclear power plant
NiTi on stainless steel via laser bed fusion
NiTi on stainless steel via laser bed fusion

All kinds of research

ZEISS Crossbeam 550 FIB-SEM has widespread applications in metallurgy, ceramics, composites, polymers, geology, arts, biology, pharmaceuticals, forensics, and other disciplines.

Veins of concentrated salt after fractional crystallisation
Veins of concentrated salt after fractional crystallisation
A FIB cross-section of a thick graphene coating
High-resolution image of a carbon filter
Battery cathode with single-walled carbon nanotubes
Diffusion bonded 316H and Esshete1250 stainless steel

Technical specifications

General specifications 
Scanning electron gun 
SEM voltage 0.02-30 kV 
SEM probe intensity 10 pA – 40 nA 
SEM magnification 12- 2,000,000 x 
SEM resolution 1.6 nm at 1 kV 
Focused ion beam gun 
FIB voltage 30 kV 
FIB probe intensity 1pA – 100nA 
FIB magnification 300 – 500,000 x 
FIB resolution 3 nm at 30 kV 
Detectors 
In-Chamber Everhart Thornley SE2 Surface contrast, long range 
In-Lens SE2 Surface contrast, short range 
In-Lens ESB Material contrast 
In-chamber retractable large-area diode-based BSD Material contrast 
In-chamber retractable annular multi-mode aSTEM detector High resolution, surface and material contrast  
Oxford Instrument Ultim Max EDS detector High sensitivity and speed 
Oxford Instrument Ultim Extreme Windowless EDS detector High spatial resolution, 1 to 7 kV 
Oxford Instrument Symmetry S2 EBSD CMOS detector High sensitivity and indexing speed of > 4000 patterns per second (pps) 

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